@misc{indiciae95e3bdb95879,
  title = {Negative Capacitance Enables FinFET Scaling Beyond 3nm Node},
  author = {Ming-Yen Kao and Harshit Agarwal and Yu-Hung Liao and Suraj Cheema and Avirup Dasgupta and Pragya Kushwaha and Ava Tan and Sayeef Salahuddin and Chenming Hu},
  year = {2020},
  doi = {10.1016/j.sse.2021.108010},
  url = {https://arxiv.org/abs/2007.14448},
  note = {Source identifier: 2007.14448}
}