TY  - RPRT
TI  - Order-Disorder Behavior at Thin Film Oxide Interfaces
AU  - Steven R. Spurgeon
PY  - 2020
DO  - 10.1016/j.cossms.2020.100870
UR  - https://arxiv.org/abs/2007.15136
ID  - 2007.15136
ER  -