@misc{indiciaef3e0896f790e,
  title = {Radiative capture rates at deep defects from electronic structure calculations},
  author = {Cyrus E. Dreyer and Audrius Alkauskas and John L. Lyons and Chris G. Van de Walle},
  year = {2020},
  url = {https://arxiv.org/abs/2008.02732},
  note = {Source identifier: 2008.02732}
}