TY  - RPRT
TI  - Radiative capture rates at deep defects from electronic structure calculations
AU  - Cyrus E. Dreyer
AU  - Audrius Alkauskas
AU  - John L. Lyons
AU  - Chris G. Van de Walle
PY  - 2020
UR  - https://arxiv.org/abs/2008.02732
ID  - 2008.02732
ER  -