@misc{indiciaecafdbadc7b15,
  title = {Piezoresistance in defect-engineered silicon},
  author = {H. Li and A. Thayil and C. T. K. Lew and M. Filoche and B. C. Johnson and J. C. McCallum and S. Arscott and A. C. H. Rowe},
  year = {2021},
  doi = {10.1103/physrevapplied.15.014046},
  url = {https://arxiv.org/abs/2008.04788},
  note = {Source identifier: 2008.04788}
}