TY  - RPRT
TI  - Origin of Mechanical and Dielectric Losses from Two-Level Systems in Amorphous Silicon
AU  - M. Molina-Ruiz
AU  - Y. J. Rosen
AU  - H. C. Jacks
AU  - M. R. Abernathy
AU  - T. H. Metcalf
AU  - X. Liu
AU  - J. L Dubois
AU  - F. Hellman
PY  - 2020
DO  - 10.1103/physrevmaterials.5.035601
UR  - https://arxiv.org/abs/2008.07489
ID  - 2008.07489
ER  -