@misc{indiciae16ed58cbcdab,
  title = {The effect of data quality and model parameters on the quantitative phase analysis of X-ray diffraction data by the Rietveld method},
  author = {Matthew R. Rowles},
  year = {2021},
  doi = {10.1107/s160057672100371x},
  url = {https://arxiv.org/abs/2008.11046},
  note = {Source identifier: 2008.11046}
}