TY  - RPRT
TI  - Calibration of X-Ray Source of a Powder Diffractometer and Radiation Test of Silicon Microstrip Detectors
AU  - Emmanuel Fokitis
AU  - Theodoros Geralis
AU  - Stavros Maltezos
AU  - Nikolaos Vodinas
PY  - 2020
UR  - https://arxiv.org/abs/2008.11425
ID  - 2008.11425
ER  -