@misc{indiciaea35a188dbb40,
  title = {A sub-micron resolution, bunch-by-bunch beam trajectory feedback system and its application to reducing wakefield effects in single-pass beamlines},
  author = {D. R. Bett and P. N. Burrows and C. Perry and R. Ramjiawan and N. Terunuma and K. Kubo and T. Okugi},
  year = {2020},
  doi = {10.1088/1748-0221/16/01/p01005},
  url = {https://arxiv.org/abs/2008.12738},
  note = {Source identifier: 2008.12738}
}