TY  - RPRT
TI  - Charge-Based Compact Model for Bias-Dependent Variability of 1/f Noise in MOSFETs
AU  - Nikolaos Mavredakis
AU  - Nikolaos Makris
AU  - Predrag Habas
AU  - Matthias Bucher
PY  - 2020
DO  - 10.1109/ted.2016.2608722
UR  - https://arxiv.org/abs/2009.00917
ID  - 2009.00917
ER  -