TY  - RPRT
TI  - Analysis of Kohn-Sham Eigenfunctions Using a Convolutional Neural Network in Simulations of the Metal-insulator Transition in Doped Semiconductors
AU  - Yosuke Harashima
AU  - Tomohiro Mano
AU  - Keith Slevin
AU  - Tomi Ohtsuki
PY  - 2021
DO  - 10.7566/jpsj.90.094001
UR  - https://arxiv.org/abs/2009.02987
ID  - 2009.02987
ER  -