@misc{indiciaec86006db4c91,
  title = {Local probe of the interlayer coupling strength of few-layers SnSe by contact-resonance atomic force microscopy},
  author = {Zhiyue Zheng and Yuhao Pan and Tengfei Pei and Rui Xu and Kunqi Xu and Le Lei and Sabir Hussain and Xiaojun Liu and Lihong Bao and Hong-Jun Gao and Wei Ji and Zhihai Cheng},
  year = {2020},
  url = {https://arxiv.org/abs/2009.04205},
  note = {Source identifier: 2009.04205}
}