TY  - RPRT
TI  - Nanoscale structural characterization of manganite thin films integrated to silicon correlated with their magnetic and electric properties
AU  - Aneely Carrero
AU  - Augusto Roman
AU  - Myriam Aguirre
AU  - Laura B. Steren
PY  - 2020
DO  - 10.1016/j.tsf.2020.138189
UR  - https://arxiv.org/abs/2009.07043
ID  - 2009.07043
ER  -