TY  - RPRT
TI  - A Numerical Fitting Routine for Frequency-domain Thermoreflectance Measurements of Nanoscale Material Systems having Arbitrary Geometries
AU  - Ronald J. Warzoha
AU  - Adam A. Wilson
AU  - Brian F. Donovan
AU  - Andrew N. Smith
AU  - Nicholas T. Vu
AU  - Trent Perry
AU  - Longnan Li
AU  - Nenad Miljkovic
AU  - Elizabeth Getto
PY  - 2020
DO  - 10.1063/5.0030168
UR  - https://arxiv.org/abs/2009.09916
ID  - 2009.09916
ER  -