@misc{indiciae047b73ace1c4,
  title = {Thickness identification of thin InSe by optical microscopy methods},
  author = {Qinghua Zhao and Sergio Puebla and Wenliang Zhang and Tao Wang and Riccardo Frisenda and Andres Castellanos-Gomez},
  year = {2020},
  doi = {10.1002/adpr.202000025},
  url = {https://arxiv.org/abs/2009.10489},
  note = {Source identifier: 2009.10489}
}