TY  - RPRT
TI  - Thickness identification of thin InSe by optical microscopy methods
AU  - Qinghua Zhao
AU  - Sergio Puebla
AU  - Wenliang Zhang
AU  - Tao Wang
AU  - Riccardo Frisenda
AU  - Andres Castellanos-Gomez
PY  - 2020
DO  - 10.1002/adpr.202000025
UR  - https://arxiv.org/abs/2009.10489
ID  - 2009.10489
ER  -