@misc{indiciaed6ee37b4e7ae,
  title = {Drift of sensitive direction of Hall-effect devices in (100)-silicon caused by mechanical shear stress},
  author = {Udo Ausserlechner and Michael Holliber and Benjamin Kollmitzer and Richard Heinz},
  year = {2020},
  doi = {10.1016/j.sse.2020.107918},
  url = {https://arxiv.org/abs/2009.11604},
  note = {Source identifier: 2009.11604}
}