TY  - RPRT
TI  - Drift of sensitive direction of Hall-effect devices in (100)-silicon caused by mechanical shear stress
AU  - Udo Ausserlechner
AU  - Michael Holliber
AU  - Benjamin Kollmitzer
AU  - Richard Heinz
PY  - 2020
DO  - 10.1016/j.sse.2020.107918
UR  - https://arxiv.org/abs/2009.11604
ID  - 2009.11604
ER  -