TY  - RPRT
TI  - The Effect of Pitch Distance on the Statistics and Morphology of Through-Silicon Via Extrusion
AU  - Golareh Jalilvand
AU  - Omar Ahmed
AU  - Nicolas Dube
AU  - Tengfei Jiang
PY  - 2020
UR  - https://arxiv.org/abs/2009.12388
ID  - 2009.12388
ER  -