TY  - RPRT
TI  - Variation in interface strength of Silicon with surface engineered Ti3C2 MXenes
AU  - Vidushi Sharma
AU  - Dibakar Datta
PY  - 2020
DO  - 10.1039/d0cp06190e
UR  - https://arxiv.org/abs/2009.12712
ID  - 2009.12712
ER  -