TY  - RPRT
TI  - High Fidelity Entangling Gates in a 3D Ion Crystal under Micromotion
AU  - Y. -K. Wu
AU  - Z. -D. Liu
AU  - W. -D. Zhao
AU  - L. -M. Duan
PY  - 2021
DO  - 10.1103/physreva.103.022419
UR  - https://arxiv.org/abs/2009.13007
ID  - 2009.13007
ER  -