TY  - RPRT
TI  - Oxygen annealing induced changes in defects within beta-Ga2O3 epitaxial films measured using photoluminescence
AU  - Rujun Sun
AU  - Yu Kee Ooi
AU  - Praneeth Ranga
AU  - Arkka Bhattacharyya
AU  - Sriram Krishnamoorthy
AU  - Michael A. Scarpulla
PY  - 2020
UR  - https://arxiv.org/abs/2009.14741
ID  - 2009.14741
ER  -