@misc{indiciae2bac9c4374af,
  title = {Determination of the Gate Breakdown Mechanisms in p-GaN Gate HEMTs by Multiple-gate-sweep Measurements},
  author = {Guangnan Zhou and Fanming Zeng and Yang Jiang and Qing Wang and Lingli Jiang and Guangrui and Xia and Hongyu Yu},
  year = {2020},
  doi = {10.1109/ted.2021.3057007},
  url = {https://arxiv.org/abs/2009.14803},
  note = {Source identifier: 2009.14803}
}