TY  - RPRT
TI  - Determination of the Gate Breakdown Mechanisms in p-GaN Gate HEMTs by Multiple-gate-sweep Measurements
AU  - Guangnan Zhou
AU  - Fanming Zeng
AU  - Yang Jiang
AU  - Qing Wang
AU  - Lingli Jiang
AU  - Guangrui
AU  - Xia
AU  - Hongyu Yu
PY  - 2020
DO  - 10.1109/ted.2021.3057007
UR  - https://arxiv.org/abs/2009.14803
ID  - 2009.14803
ER  -