TY  - RPRT
TI  - Vacancy defects induced changes in the electronic and optical properties of NiO studied by spectroscopic ellipsometry and first-principles calculations
AU  - Kingsley O. Egbo
AU  - Chao Ping Liu
AU  - Chinedu E. Ekuma
AU  - Kin Man Yu
PY  - 2020
DO  - 10.1063/5.0021650
UR  - https://arxiv.org/abs/2010.03562
ID  - 2010.03562
ER  -