TY  - RPRT
TI  - A high-fidelity method for a single-step $N$-bit Toffoli gate in trapped ions
AU  - Juan Diego Arias Espinoza
AU  - Koen Groenland
AU  - Matteo Mazzanti
AU  - Kareljan Schoutens
AU  - Rene Gerritsma
PY  - 2020
DO  - 10.1103/physreva.103.052437
UR  - https://arxiv.org/abs/2010.08490
ID  - 2010.08490
ER  -