TY  - RPRT
TI  - Determination of the Interface between Amorphous Insulator and Crystalline 4H-SiC in Transmission Electron Microscope Image by using Convolutional Neural Network
AU  - Hironori Yoshioka
AU  - Tomonori Honda
PY  - 2020
DO  - 10.1063/5.0036982
UR  - https://arxiv.org/abs/2010.09485
ID  - 2010.09485
ER  -