@misc{indiciaeb3222a701c9c,
  title = {Impact of invasive metal probes on Hall measurements in semiconductor nanostructures},
  author = {J. G. Gluschke and J. Seidl and H. H. Tan and C. Jagadish and P. Caroff and A. P. Micolich},
  year = {2020},
  doi = {10.1039/d0nr04402d},
  url = {https://arxiv.org/abs/2010.09883},
  note = {Source identifier: 2010.09883}
}