TY  - RPRT
TI  - Measurement of the transmission secondary electron yield of nanometer-thick films in a prototype Timed Photon Counter
AU  - T. H. A. van der Reep
AU  - B. Looman
AU  - H. W. Chan
AU  - C. W. Hagen
AU  - H. van der Graaf
PY  - 2020
DO  - 10.1088/1748-0221/15/10/p10022
UR  - https://arxiv.org/abs/2010.12462
ID  - 2010.12462
ER  -