@misc{indiciae5d9a1a0d6f4c,
  title = {Learning Assisted Side Channel Delay Test for Detection of Recycled ICs},
  author = {Ashkan Vakil and Farzad Niknia and Ali Mirzaeian and Avesta Sasan and Naghmeh Karimi},
  year = {2020},
  url = {https://arxiv.org/abs/2010.12704},
  note = {Source identifier: 2010.12704}
}