TY  - RPRT
TI  - Learning Assisted Side Channel Delay Test for Detection of Recycled ICs
AU  - Ashkan Vakil
AU  - Farzad Niknia
AU  - Ali Mirzaeian
AU  - Avesta Sasan
AU  - Naghmeh Karimi
PY  - 2020
UR  - https://arxiv.org/abs/2010.12704
ID  - 2010.12704
ER  -