TY  - RPRT
TI  - Structural, chemical and optical characterizations of nanocrystallized AlN:Er thin films prepared by r.f. magnetron sputtering
AU  - Valerie Brien
AU  - P. Miska
AU  - H. Rinnert
AU  - D. Genève
AU  - P. Pigeat
PY  - 2020
DO  - 10.1016/j.mseb.2007.07.018
UR  - https://arxiv.org/abs/2010.13414
ID  - 2010.13414
ER  -