TY  - RPRT
TI  - Charge carrier density noise in graphene: effect of localized/delocalized traps
AU  - Francesco M. D. Pellegrino
AU  - Giuseppe Falci
AU  - Elisabetta Paladino
PY  - 2020
DO  - 10.1088/1742-5468/ab3a26
UR  - https://arxiv.org/abs/2011.04774
ID  - 2011.04774
ER  -