@misc{indiciae1e91db7a52eb,
  title = {Variability and Fidelity Limits of Silicon Quantum Gates Due to Random Interface Charge Traps},
  author = {Tong Wu and Jing Guo},
  year = {2020},
  doi = {10.1109/led.2020.2997009},
  url = {https://arxiv.org/abs/2011.05486},
  note = {Source identifier: 2011.05486}
}