TY  - RPRT
TI  - Variability and Fidelity Limits of Silicon Quantum Gates Due to Random Interface Charge Traps
AU  - Tong Wu
AU  - Jing Guo
PY  - 2020
DO  - 10.1109/led.2020.2997009
UR  - https://arxiv.org/abs/2011.05486
ID  - 2011.05486
ER  -