TY  - RPRT
TI  - Leveraging the Defects Life Cycle to Label Affected Versions and Defective Classes
AU  - Bailey Vandehei
AU  - Daniel Alencar da Costa
AU  - Davide Falessi
PY  - 2020
UR  - https://arxiv.org/abs/2011.05531
ID  - 2011.05531
ER  -