TY  - RPRT
TI  - Non-universal Scaling of Thermoelectric Efficiency in 3D and 2D Thermoelectric Semiconductors
AU  - Kevin Octavian
AU  - Eddwi H. Hasdeo
PY  - 2020
UR  - https://arxiv.org/abs/2011.06321
ID  - 2011.06321
ER  -