TY  - RPRT
TI  - Characterization of the Chemical and Electrical Properties of Defects at the Niobium-Silicon Interface
AU  - Cameron Kopas
AU  - Madhu Krishna Murthy
AU  - Christopher Gregory
AU  - Bryan Ibarra Mercado
AU  - Daniel R. Queen
AU  - Brian Wagner
AU  - Nathan Newman
PY  - 2020
UR  - https://arxiv.org/abs/2011.08359
ID  - 2011.08359
ER  -