TY  - RPRT
TI  - Localization of defects via residence time measures
AU  - Emilio N. M. Cirillo
AU  - Alessandro Ciallella
AU  - Barbara Vantaggi
PY  - 2020
DO  - 10.1137/20m1380284
UR  - https://arxiv.org/abs/2011.08624
ID  - 2011.08624
ER  -