@misc{indiciaedd6f1a4c4f0e,
  title = {Stress distribution at the AlN/SiC heterointerface probed by Raman spectroscopy},
  author = {I. D. Breev and K. V. Likhachev and V. V. Yakovleva and R. Hübner and G. V. Astakhov and P. G. Baranov and E. N. Mokhov and A. N. Anisimov},
  year = {2020},
  doi = {10.1063/5.0029682},
  url = {https://arxiv.org/abs/2011.13693},
  note = {Source identifier: 2011.13693}
}