TY  - RPRT
TI  - Silicon cantilevers locally heated from 300K up to the melting point: temperature profile measurement from their resonances frequency shift
AU  - Basile Pottier
AU  - Felipe Aguilar
AU  - Mickaël Geitner
AU  - Francisco Melo
AU  - Ludovic Bellon
PY  - 2021
DO  - 10.1063/5.0040733
UR  - https://arxiv.org/abs/2012.00421
ID  - 2012.00421
ER  -