TY  - RPRT
TI  - Instrument for in situ hard x-ray nanobeam characterization during epitaxial crystallization and materials transformations
AU  - Samuel D. Marks
AU  - Peiyu Quan
AU  - Rui Liu
AU  - Matthew J. Highland
AU  - Hua Zhou
AU  - Thomas F. Keuch
AU  - G. Brian Stephenson
AU  - Paul G. Evans
PY  - 2020
DO  - 10.1063/5.0039196
UR  - https://arxiv.org/abs/2012.00516
ID  - 2012.00516
ER  -