@misc{indiciae4853ce176d71,
  title = {Understanding the Memory Window Overestimation of 2D Materials Based Floating Gate Type Memory Devices by Measuring Floating Gate Voltage},
  author = {Taro Sasaki and Keiji Ueno and Takashi Taniguchi and Kenji Watanabe and Tomonori Nishimura and Kosuke Nagashio},
  year = {2020},
  doi = {10.1002/smll.202004907},
  url = {https://arxiv.org/abs/2012.01155},
  note = {Source identifier: 2012.01155}
}