TY  - RPRT
TI  - Understanding the Memory Window Overestimation of 2D Materials Based Floating Gate Type Memory Devices by Measuring Floating Gate Voltage
AU  - Taro Sasaki
AU  - Keiji Ueno
AU  - Takashi Taniguchi
AU  - Kenji Watanabe
AU  - Tomonori Nishimura
AU  - Kosuke Nagashio
PY  - 2020
DO  - 10.1002/smll.202004907
UR  - https://arxiv.org/abs/2012.01155
ID  - 2012.01155
ER  -