@misc{indiciae4f1ce8952bd6,
  title = {Physical Mechanism behind the Hysteresis-free Negative Capacitance Effect in Metal-Ferroelectric-Insulator-Metal Capacitors with Dielectric Leakage and Interfacial Trapped Charges},
  author = {Chia-Sheng Hsu and Sou-Chi Chang and Dmitri E. Nikonov and Ian A. Young and Azad Naeemi},
  year = {2020},
  doi = {10.1103/physrevapplied.15.034048},
  url = {https://arxiv.org/abs/2012.02691},
  note = {Source identifier: 2012.02691}
}