TY  - RPRT
TI  - Physical Mechanism behind the Hysteresis-free Negative Capacitance Effect in Metal-Ferroelectric-Insulator-Metal Capacitors with Dielectric Leakage and Interfacial Trapped Charges
AU  - Chia-Sheng Hsu
AU  - Sou-Chi Chang
AU  - Dmitri E. Nikonov
AU  - Ian A. Young
AU  - Azad Naeemi
PY  - 2020
DO  - 10.1103/physrevapplied.15.034048
UR  - https://arxiv.org/abs/2012.02691
ID  - 2012.02691
ER  -