TY  - RPRT
TI  - Interferometric 4D-STEM for Lattice Distortion and Interlayer Spacing Measurements in Bilayer and Trilayer Two-dimensional Materials
AU  - Michael J Zachman
AU  - Jacob Madsen
AU  - Xiang Zhang
AU  - Pulickel M Ajayan
AU  - Toma Susi
AU  - Miaofang Chi
PY  - 2021
DO  - 10.1002/smll.202100388
UR  - https://arxiv.org/abs/2012.02822
ID  - 2012.02822
ER  -