@misc{indiciaef054c2f8b5c8,
  title = {Multiwavelength electron diffraction as a tool for identifying stacking sequences in 2D materials},
  author = {Pascal Puech and Iann Gerber and Fabrice Piazza and Marc Monthioux},
  year = {2020},
  url = {https://arxiv.org/abs/2012.08869},
  note = {Source identifier: 2012.08869}
}