TY  - RPRT
TI  - Multiwavelength electron diffraction as a tool for identifying stacking sequences in 2D materials
AU  - Pascal Puech
AU  - Iann Gerber
AU  - Fabrice Piazza
AU  - Marc Monthioux
PY  - 2020
UR  - https://arxiv.org/abs/2012.08869
ID  - 2012.08869
ER  -