TY  - RPRT
TI  - Constructive and Destructive Interference of Kerker-type Scattering in an Ultra-thin Silicon Huygens Metasurface
AU  - Xia Zhang
AU  - Jing Li
AU  - John F. Donegan
AU  - A. Louise Bradley
PY  - 2020
DO  - 10.1103/physrevmaterials.4.125202
UR  - https://arxiv.org/abs/2012.12173
ID  - 2012.12173
ER  -